86 search results - page 5 / 18 » Slipstream Processors: Improving both Performance and Fault ... |
ISPA
2007
Springer
15 years 3 months ago
2007
Springer
The number of processors embedded in high performance computing platforms is growing daily to solve larger and more complex problems. The logical network topologies must also suppo...
DATE
2007
IEEE
15 years 4 months ago
2007
IEEE
Device scaling in new and future technologies brings along severe increase in the soft error rate of circuits, for combinational and sequential logic. Although potential solutions...
IEEEPACT
2007
IEEE
15 years 4 months ago
2007
IEEE
Continued scaling of CMOS technology to smaller transistor sizes makes modern processors more susceptible to both transient and permanent hardware faults. Circuitlevel techniques ...
DAC
2006
ACM
14 years 11 months ago
2006
ACM
Software-based self-test (SBST) has recently emerged as an effective methodology for the manufacturing test of processors and other components in systems-on-chip (SoCs). By moving ...
IEEEPACT
2007
IEEE
15 years 4 months ago
2007
IEEE
Under current worst-case design practices, manufacturers specify conservative values for processor frequencies in order to guarantee correctness. To recover some of the lost perfo...