20 search results - page 4 / 4 » Soft Error Hardening for Asynchronous Circuits |
DAC
2008
ACM
14 years 7 months ago
2008
ACM
Soft errors, once only of concern in memories, are beginning to affect logic as well. Determining the soft error rate (SER) of a combinational circuit involves three main masking ...
DAC
2005
ACM
13 years 8 months ago
2005
ACM
1 This paper presents a transient faults sensitivity evaluation for Quasi Delay Insensitive (QDI) asynchronous circuits. Because of their specific architecture, asynchronous circui...
DATE
2005
IEEE
13 years 12 months ago
2005
IEEE
Very deep submicron and nanometer technologies have increased notably integrated circuit (IC) sensitiveness to radiation. Soft errors are currently appearing into ICs working at e...
DAC
2005
ACM
13 years 8 months ago
2005
ACM
Reliability of nanometer circuits is becoming a major concern in today’s VLSI chip design due to interferences from multiple noise sources as well as radiation-induced soft erro...
VLSID
2006
IEEE
14 years 6 months ago
2006
IEEE
With device size shrinking and fast rising frequency ranges, effect of cosmic radiations and alpha particles known as Single-Event-Upset (SEU), Single-Eventtransients (SET), is a ...