49 search results - page 2 / 10 » Soft error derating computation in sequential circuits |
DATE
2007
IEEE
15 years 5 months ago
2007
IEEE
Due to reduction in device feature size and supply voltage, the sensitivity to radiation induced transient faults (soft errors) of digital systems increases dramatically. Intensiv...
ICCD
2008
IEEE
15 years 8 months ago
2008
IEEE
- This paper performs analysis and design of latches and flip-flops while considering the effect of event upsets caused by energetic particle hits. First it is shown that the conve...
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CSREAESA
2006
15 years 29 days ago
2006
- Triple Modular Redundancy is widely used in dependable systems design to ensure high reliability against soft errors. Conventional TMR is effective in protecting sequential circu...
ISQED
2010
IEEE
15 years 4 months ago
2010
IEEE
We analyze the neutron induced soft error rate (SER) by modeling induced error pulse using two parameters, occurrence frequency and probability density function for the pulse widt...
DATE
2006
IEEE
15 years 5 months ago
2006
IEEE
Soft errors have emerged as an important reliability challenge for nanoscale VLSI designs. In this paper, we present a fast and efficient soft error rate (SER) computation algorit...