49 search results - page 6 / 10 » Soft error derating computation in sequential circuits |
VLSID
2006
IEEE
15 years 12 months ago
2006
IEEE
Radiation induced soft errors in combinational logic is expected to become as important as directly induced errors on state elements. Consequently, it has become important to deve...
VLSID
2009
IEEE
16 years 6 days ago
2009
IEEE
We analyze the neutron induced soft error rate (SER). An induced error pulse is modeled by two parameters, probability of occurrence and probability density function of the pulse ...
DAC
2009
ACM
16 years 18 days ago
2009
ACM
State elements are increasingly vulnerable to soft errors due to their decreasing size, and the fact that latched errors cannot be completely eliminated by electrical or timing ma...
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VLSID
2005
IEEE
15 years 12 months ago
2005
IEEE
We propose a novel, non-simulative, probabilistic model for switching activity in sequential circuits, capturing both spatio-temporal correlations at internal nodes and higher ord...
DAC
1998
ACM
15 years 3 months ago
1998
ACM
This papers describes a new, fast and economical methodology to test linear analog circuits based on adaptive algorithms. To the authors knowledge, this is the first time such tec...