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VTS
1997
IEEE
86views Hardware» more  VTS 1997»
15 years 9 months ago
Methods to reduce test application time for accumulator-based self-test
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
Albrecht P. Stroele, Frank Mayer
ICST
2009
IEEE
15 years 11 months ago
Seasonal Variation in the Vulnerability Discovery Process
Vulnerability discovery rates need to be taken into account for evaluating security risks. Accurate projection of these rates is required to estimate the effort needed to develop ...
HyunChul Joh, Yashwant K. Malaiya
MKWI
2008
143views Business» more  MKWI 2008»
15 years 6 months ago
Designing and Implementing a Tool for Distributed Collaborative Traceability and Rationale Management
: Traceability and rationale management are highly important--especially in distributed collaborative software development projects due to a lack of mutual awareness and informal c...
Tobias Hildenbrand, Michael Geisser, Lars Klimpke,...
IV
2008
IEEE
107views Visualization» more  IV 2008»
15 years 11 months ago
Design Patterns for Rapid Visualization Prototyping
In this paper we present three software design patterns for rapid prototyping of information visualization applications. The first pattern describes a mapping of object oriented ...
Mark Giereth, Thomas Ertl
OOPSLA
2010
Springer
15 years 2 months ago
A recommender for conflict resolution support in optimistic model versioning
The usage of optimistic version control systems comes along with cumbersome and time-consuming conflict resolution in the case that the modifications of two developers are contrad...
Petra Brosch, Martina Seidl, Gerti Kappel