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106
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ISSRE
2008
IEEE
15 years 10 months ago
RUGRAT: Runtime Test Case Generation Using Dynamic Compilers
Ben Breech, Lori L. Pollock, John Cavazos
ISSRE
2008
IEEE
15 years 10 months ago
Vulnerability Discovery Modeling Using Weibull Distribution
HyunChul Joh, Jinyoo Kim, Yashwant K. Malaiya
122
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ISSRE
2008
IEEE
15 years 10 months ago
Profiling the Operational Behavior of OS Device Drivers
Constantin Sârbu, Andréas Johansson, ...
108
Voted
IWPC
2008
IEEE
15 years 10 months ago
Impact of Limited Memory Resources
David Binkley, Dawn Lawrie, Steve Maex, Christophe...