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148
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ISSRE
2008
IEEE
16 years 1 months ago
RUGRAT: Runtime Test Case Generation Using Dynamic Compilers
Ben Breech, Lori L. Pollock, John Cavazos
139
Voted
ISSRE
2008
IEEE
16 years 1 months ago
Vulnerability Discovery Modeling Using Weibull Distribution
HyunChul Joh, Jinyoo Kim, Yashwant K. Malaiya
IWPC
2008
IEEE
16 years 1 months ago
Impact of Limited Memory Resources
David Binkley, Dawn Lawrie, Steve Maex, Christophe...