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113
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APSEC
2004
IEEE
15 years 3 months ago
2004
IEEE
Unit testing is a methodology for testing small parts of an application independently of whatever application uses them. It is time consuming and tedious to write unit tests, and ...
TASE
2008
IEEE
14 years 11 months ago
2008
IEEE
Abstract--Cluster tools are widely used as semiconductor manufacturing equipment. While throughput analysis and scheduling of single-cluster tools have been well-studied, research ...
135
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TASE
2010
IEEE
14 years 6 months ago
2010
IEEE
This paper presents a robust calibration procedure for clustered wireless sensor networks. Accurate calibration of between-node distances is one crucial step in localizing sensor n...
144
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PAMI
2012
13 years 2 months ago
2012
— Over the last century, Component Analysis (CA) methods such as Principal Component Analysis (PCA), Linear Discriminant Analysis (LDA), Canonical Correlation Analysis (CCA), Lap...
110
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ISSRE
2000
IEEE
15 years 4 months ago
2000
IEEE
Despite the growing interest for component-based systems, few works tackle the question of the trust we can bring into a component. This paper presents a method and a tool for bui...