—For nanoscale interconnection, the scattering effect will soon become prominent due to scaling. It will increase the effective resistivity and thus interconnection delay signifi...
The test signal method can be used to measure and model inductance parameters (self and mutual) of a very small interconnect especially in highdensity IC’s by using a test signa...
Modeling on-chip inductive effects for interconnects of multigigahertz microprocessors remains challenging. SPICE simulation of these effects is very slow because of the large num...
Xiaoning Qi, Goetz Leonhardt, Daniel Flees, Xiao-D...
- This paper describes a new architectural paradigm for fully connected, single-hop system level interconnection networks. The architecture is scalable enough to meet the needs of ...
Kelli Ireland, Donald M. Chiarulli, Steven P. Levi...
— This paper describes an algorithm for generating provably passive reduced-order N-port models for RLC interconnect circuits. It is demonstrated that, in addition to macromodel ...
Altan Odabasioglu, Mustafa Celik, Lawrence T. Pile...