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» Software Process - Standards, Assessments and Improvement
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ASPDAC
2007
ACM
98views Hardware» more  ASPDAC 2007»
14 years 11 months ago
A Software Technique to Improve Yield of Processor Chips in Presence of Ultra-Leaky SRAM Cells Caused by Process Variation
- Exceptionally leaky transistors are increasingly more frequent in nano-scale technologies due to lower threshold voltage and its increased variation. Such leaky transistors may e...
Maziar Goudarzi, Tohru Ishihara, Hiroto Yasuura
COMPUTER
2007
66views more  COMPUTER 2007»
14 years 9 months ago
Software Process Improvement: The Competisoft Project
Hanna Oktaba, Félix García, Mario Pi...