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» Software Process - Standards, Assessments and Improvement
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ASPDAC
2007
ACM
98views Hardware» more  ASPDAC 2007»
15 years 1 months ago
A Software Technique to Improve Yield of Processor Chips in Presence of Ultra-Leaky SRAM Cells Caused by Process Variation
- Exceptionally leaky transistors are increasingly more frequent in nano-scale technologies due to lower threshold voltage and its increased variation. Such leaky transistors may e...
Maziar Goudarzi, Tohru Ishihara, Hiroto Yasuura
COMPUTER
2007
66views more  COMPUTER 2007»
14 years 11 months ago
Software Process Improvement: The Competisoft Project
Hanna Oktaba, Félix García, Mario Pi...