3514 search results - page 318 / 703 » Software Process Modeling: Principles of Entity Process Mode... |
120
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ASPDAC
2008
ACM
15 years 6 months ago
2008
ACM
In nanometer regime, IC designs have to consider the impact of process variations, which is often indicated by manufacturing/parametric yield. This paper investigates a yield model...
163
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ICCD
2002
IEEE
16 years 29 days ago
2002
IEEE
A large and increasing number of modern embedded systems are subject to tight power/energy constraints. It has been demonstrated that the operating system (OS) can have a signifi...
124
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COMPSAC
2006
IEEE
15 years 10 months ago
2006
IEEE
Web applications have become complex and crucial in many fields. In order to assure their quality, a high demand for systematic methodologies of Web application testing is emergin...
141
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MSR
2009
ACM
15 years 10 months ago
2009
ACM
Defect prediction is an important task in the mining of software repositories, but the quality of predictions varies strongly within and across software projects. In this paper we...
127
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WWW
2007
ACM
16 years 4 months ago
2007
ACM
In a new model for answer retrieval, document collections are distilled offline into large repositories of facts. Each fact constitutes a potential direct answer to questions seek...