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ASPDAC
2007
ACM
98views Hardware» more  ASPDAC 2007»
15 years 5 months ago
A Software Technique to Improve Yield of Processor Chips in Presence of Ultra-Leaky SRAM Cells Caused by Process Variation
- Exceptionally leaky transistors are increasingly more frequent in nano-scale technologies due to lower threshold voltage and its increased variation. Such leaky transistors may e...
Maziar Goudarzi, Tohru Ishihara, Hiroto Yasuura
119
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CSREAESA
2006
15 years 5 months ago
Model Based Software Development Process For Production Applications
M. S. Chandrashekar, Susan Dong, Naveen Alwandi