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DATE
2006
IEEE
75views Hardware» more  DATE 2006»
15 years 8 months ago
Space of DRAM fault models and corresponding testing
Abstract: DRAMs play an important role in the semiconductor industry, due to their highly dense layout and their low price per bit. This paper presents the first framework of faul...
Zaid Al-Ars, Said Hamdioui, A. J. van de Goor
DEXAW
2006
IEEE
171views Database» more  DEXAW 2006»
15 years 8 months ago
The PENG System: Practice and Experience
The PENG system is intended to provide an integrated and personalized environment for news professionals, providing functionalities for filtering, distributed retrieval, and a fle...
Gabriella Pasi, Gloria Bordogna, Robert Villa
HICSS
2006
IEEE
117views Biometrics» more  HICSS 2006»
15 years 8 months ago
Planning for a Big Bang in a Supply Chain: Fast Hedging for Production Indicators
— We concern ourselves with the process of making optimized production planning decisions in the face of low frequency, high impact uncertainty, which takes the form of a small n...
David L. Woodruff, Stefan Voß
ICDM
2006
IEEE
108views Data Mining» more  ICDM 2006»
15 years 7 months ago
Minimum Enclosing Spheres Formulations for Support Vector Ordinal Regression
We present two new support vector approaches for ordinal regression. These approaches find the concentric spheres with minimum volume that contain most of the training samples. B...
Shirish Krishnaj Shevade, Wei Chu
ICMCS
2006
IEEE
122views Multimedia» more  ICMCS 2006»
15 years 7 months ago
An Improved Approach to the Line-Based Face Recognition
The line-based face recognition method is distinguished by its features, but its development and application is limited to some inherent drawbacks. This paper propose a method for...
Anlong Ming, Huadong Ma