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17 years 4 months ago
Within-die Process Variations: How Accurately can They Be Statistically Modeled?
Within-die process variations arise during integrated circuit (IC) fabrication in the sub-100nm regime. These variations are of paramount concern as they deviate the performance of...
Brendan Hargreaves, Henrik Hult, Sherief Reda
CVPR
2007
IEEE
16 years 6 months ago
Harmony in Motion
Cross-modal analysis offers information beyond that extracted from individual modalities. Consider a camcorder having a single microphone in a cocktail-party: it captures several ...
Zohar Barzelay, Yoav Y. Schechner
ECCV
2000
Springer
16 years 6 months ago
Gray Scale and Rotation Invariant Texture Classification with Local Binary Patterns
This paper presents a theoretically very simple yet efficient approach for gray scale and rotation invariant texture classification based on local binary patterns and nonparametric...
Timo Ojala, Matti Pietikäinen, Topi Mäen...
ICIP
2006
IEEE
16 years 6 months ago
Unsupervised Image Layout Extraction
We propose a novel unsupervised learning algorithm to extract the layout of an image by learning latent object-related aspects. Unlike traditional image segmentation algorithms th...
David Liu, Datong Chen, Tsuhan Chen
ICIP
2005
IEEE
16 years 6 months ago
Fusion of multiple viewpoint information towards 3D face robust orientation detection
This paper presents a novel approach to the problem of determining head pose estimation and face 3D orientation of several people in low resolution sequences from multiple calibra...
Cristian Canton-Ferrer, Josep R. Casas, Montse Par...