Sciweavers

89 search results - page 10 / 18
» Specification Coverage for Testing in Circus
Sort
View
DATE
2002
IEEE
97views Hardware» more  DATE 2002»
15 years 4 months ago
Analog IP Testing: Diagnosis and Optimization
In this paper, we present an innovative methodology to estimate and improve the quality of analog and mixed-signal circuit testing. We first detect and reduce the redundancy in th...
Carlo Guardiani, Patrick McNamara, Lidia Daldoss, ...
JSW
2007
107views more  JSW 2007»
14 years 11 months ago
Reducing Domain Level Scenarios to Test Component-based Software
—Higher-order black box software tests against independent end user domain requirements has become an issue of increasing importance with compositional reuse of software artifact...
Oliver Skroch, Klaus Turowski
ICCAD
1998
IEEE
117views Hardware» more  ICCAD 1998»
15 years 4 months ago
CONCERT: a concurrent transient fault simulator for nonlinear analog circuits
This paper presents a novel concurrent fault simulator (called CONCERT) for nonlinear analog circuits. Three primary techniques in CONCERT, including fault ordering, state predict...
Junwei Hou, Abhijit Chatterjee
ITC
1998
IEEE
114views Hardware» more  ITC 1998»
15 years 3 months ago
BETSY: synthesizing circuits for a specified BIST environment
This paper presents a logic synthesis tool called BETSY (BIST Environment Testable Synthesis) for synthesizing circuits that achieve complete (100%)fault coverage in a user specif...
Zhe Zhao, Bahram Pouya, Nur A. Touba
FORTE
1997
15 years 1 months ago
A Framework for Distributed Object-Oriented Testing
Distributed programming and object-oriented programming are two popular programming paradigms. The former is driven by advances in networking technology whereas the latter provide...
Alan C. Y. Wong, Samuel T. Chanson, Shing-Chi Cheu...