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» Specification Coverage for Testing in Circus
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ITC
1997
IEEE
129views Hardware» more  ITC 1997»
15 years 1 months ago
On Using Machine Learning for Logic BIST
This paper presents a new approach for designing test sequences to be generated on–chip. The proposed technique is based on machine learning, and provides a way to generate effi...
Christophe Fagot, Patrick Girard, Christian Landra...
82
Voted
EURODAC
1994
IEEE
129views VHDL» more  EURODAC 1994»
15 years 1 months ago
Synthesis of Self-Testable Controllers
The paper presents a synthesis approach for pipelinelike controller structures. These structures allow to implement a built-in self-test in two sessions without any extra test reg...
Sybille Hellebrand, Hans-Joachim Wunderlich
86
Voted
COMPUTER
2002
75views more  COMPUTER 2002»
14 years 9 months ago
GUI Testing: Pitfalls and Process
ion, so mapping between GUI events and the underlying code is not straightforward. Code-based coverage criteria do not necessarily address problematic interactions between the GUI&...
Atif M. Memon
SIGSOFT
2007
ACM
15 years 10 months ago
Program representations for testing wireless sensor network applications
Because of the growing complexity of wireless sensor network applications (WSNs), traditional software development tools are being developed that are specifically designed for the...
Nguyet T. M. Nguyen, Mary Lou Soffa
PPOPP
2010
ACM
15 years 6 months ago
GAMBIT: effective unit testing for concurrency libraries
As concurrent programming becomes prevalent, software providers are investing in concurrency libraries to improve programmer productivity. Concurrency libraries improve productivi...
Katherine E. Coons, Sebastian Burckhardt, Madanlal...