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» Specification patterns can be formal and still easy
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ICCAD
2008
IEEE
129views Hardware» more  ICCAD 2008»
15 years 6 months ago
A capacitance solver for incremental variation-aware extraction
Abstract—Lithographic limitations and manufacturing uncertainties are resulting in fabricated shapes on wafer that are topologically equivalent, but geometrically different from ...
Tarek A. El-Moselhy, Ibrahim M. Elfadel, Luca Dani...
BMCBI
2006
119views more  BMCBI 2006»
14 years 9 months ago
LS-NMF: A modified non-negative matrix factorization algorithm utilizing uncertainty estimates
Background: Non-negative matrix factorisation (NMF), a machine learning algorithm, has been applied to the analysis of microarray data. A key feature of NMF is the ability to iden...
Guoli Wang, Andrew V. Kossenkov, Michael F. Ochs
POPL
2004
ACM
15 years 10 months ago
Principal typings for Java-like languages
The contribution of the paper is twofold. First, we define a general notion of type system equipped with an entailment relation between type environments; this generalisation serv...
Davide Ancona, Elena Zucca
ISWC
2003
IEEE
15 years 2 months ago
A Wearable Sense of Balance Monitoring System towards Daily Health Care Monitoring
We implemented a wearable system for detecting accelerations of the user's head while standing still for the purpose of developing a daily health care application. A 2axis ac...
Soichiro Matsushita, Toshihiko Oba, Kazuoki Otsuki...
DAC
1994
ACM
15 years 1 months ago
Error Diagnosis for Transistor-Level Verification
This paper describes a diagnosis technique for locating design errors in circuit implementations which do not match their functional specification. The method efficiently propagat...
Andreas Kuehlmann, David Ihsin Cheng, Arvind Srini...