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ISQED
2007
IEEE
182views Hardware» more  ISQED 2007»
15 years 10 months ago
Defect or Variation? Characterizing Standard Cell Behavior at 90nm and below
Historically, design margin and defects have been viewed as different topics, one part of design and the other part of test. Shrinking process geometries are making the two part o...
Robert C. Aitken
84
Voted
WECWIS
2007
IEEE
75views ECommerce» more  WECWIS 2007»
15 years 10 months ago
NGN Performance Monitoring and Management: Standard Perspective and its Applications
Taesang Choi, Sangsik Yoon, Joonkyung Lee