Transistor tapering is a widely used technique applied to optimize the geometries of CMOS transistors in highperformance circuit design with a view to minimizing the delay of a FE...
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
Timing-driven placement is a critical step in nanometerscale physical synthesis. To improve design timing on a global scale, net-weight based global timing-driven placement is a c...
Natarajan Viswanathan, Gi-Joon Nam, Jarrod A. Roy,...
This paper presents Timed Petri Nets (TPN) as an analytical approach for verification of computerized queueing network simulation models at steady state. It introduces a generic a...
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...