In response to the increasing variations in integrated-circuit manufacturing, the current trend is to create designs that take these variations into account statistically. In this ...
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
- With increasing availability of predefined IP (Intellectual Properties) blocks and inexpensive microprocessors, embedded system designers are faced with more design choices than ...
The growing dominance of wire delays at future technology points renders a microprocessor communication-bound. Clustered microarchitectures allow most dependence chains to execute...
In this paper the tradeoff between energy and delay for wireless networks is studied. A network using a request-to-send (RTS) and clear-to-send (CTS) type medium access control (M...
Shih Yu Chang, Wayne E. Stark, Achilleas Anastasop...