306 search results - page 52 / 62 » Statistical Delay Modeling in Logic Design and Synthesis |
ICCAD
2007
IEEE
15 years 8 months ago
2007
IEEE
— Starting at the 65nm node, stress engineering to improve performance of transistors has been a major industry focus. An intrinsic stress source – shallow trench isolation –...
ISLPED
2009
ACM
15 years 4 months ago
2009
ACM
We present experimental analysis to exploit the sequence dependence on energy saving in error tolerant image processing. Our analysis shows that the error distributions depend not...
DOLAP
2005
ACM
15 years 1 months ago
2005
ACM
Data warehouses and OLAP systems help to interactively analyze huge volume of data. This data, extracted from transactional databases, frequently contains spatial information whic...
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Voted
GLOBECOM
2006
IEEE
15 years 5 months ago
2006
IEEE
— This paper presents non-linear precoding design in closed-loop multiple-input multiple-output (MIMO) orthogonal frequency-division multiplexing (OFDM) over spatiallycorrelated,...
VLSID
2008
IEEE
16 years 1 days ago
2008
IEEE
Negative Bias Temperature Instability (NBTI) has been identified as a major and critical reliability issue for PMOS devices in nano-scale designs. It manifests as a negative thres...