61 search results - page 3 / 13 » Statistical Leakage and Timing Optimization for Submicron Pr... |
ISCAS
2005
IEEE
13 years 11 months ago
2005
IEEE
—As process variations become a significant problem in deep sub-micron technology, a shift from deterministic static timing analysis to statistical static timing analysis for hig...
VLSID
2008
IEEE
14 years 6 months ago
2008
IEEE
Compared to subthreshold leakage, dynamic power is normally much less sensitive to the process variation due to its approximately linear relation to the process parameters. Howeve...
ASPDAC
2009
ACM
14 years 23 days ago
2009
ACM
— As technology scales, the delay uncertainty caused by process variations has become increasingly pronounced in deep submicron designs. In the presence of process variations, wo...
DAC
2007
ACM
14 years 7 months ago
2007
ACM
Due to increased variability trends in nanoscale integrated circuits, statistical circuit analysis has become essential. We present a novel method for post-silicon analysis that g...
VLSID
2007
IEEE
14 years 6 months ago
2007
IEEE
As technology scales to 40nm and beyond, intra-die process variability will cause large delay and leakage variations across a chip in addition to expected die-to-die variations. I...