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» Statistical Modeling for Circuit Simulation
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IANDC
2010
84views more  IANDC 2010»
15 years 1 months ago
Underapproximation for model-checking based on universal circuits
For two naturals m, n such that m < n, we show how to construct a circuit C with m inputs and n outputs, that has the following property: for some 0 ≤ k ≤ m, the circuit deï...
Arie Matsliah, Ofer Strichman
IJON
2007
78views more  IJON 2007»
15 years 3 months ago
A non-parametric electrode model for intracellular recording
We present a new way to model the response of an electrode to an injected current. The electrode is represented by an unknown complex linear circuit, characterized by a kernel whi...
Romain Brette, Zuzanna Piwkowska, Michelle Rudolph...
ISQED
2003
IEEE
109views Hardware» more  ISQED 2003»
15 years 8 months ago
Modeling and Analysis of Power Distribution Networks for Gigabit Applications
—As the operating frequency of digital systems increases and voltage swing decreases, it becomes very important to characterize and analyze power distribution networks (PDNs) acc...
Wendemagegnehu T. Beyene, Chuck Yuan, Joong-Ho Kim...
BMCBI
2010
190views more  BMCBI 2010»
15 years 3 months ago
Sample size and statistical power considerations in high-dimensionality data settings: a comparative study of classification alg
Background: Data generated using `omics' technologies are characterized by high dimensionality, where the number of features measured per subject vastly exceeds the number of...
Yu Guo, Armin Graber, Robert N. McBurney, Raji Bal...
FPGA
2007
ACM
142views FPGA» more  FPGA 2007»
15 years 9 months ago
Parametric yield in FPGAs due to within-die delay variations: a quantitative analysis
Variations in the semiconductor fabrication process results in variability in parameters between transistors on the same die, a problem exacerbated by lithographic scaling. The re...
N. Pete Sedcole, Peter Y. K. Cheung