1459 search results - page 137 / 292 » Statistical Modeling for Circuit Simulation |
121
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ISQED
2008
IEEE
15 years 9 months ago
2008
IEEE
Negative bias temperature instability (NBTI) is one of the primary limiters of reliability lifetime in nano-scale integrated circuits. NBTI manifests itself in a gradual increase ...
101
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DFT
2002
IEEE
15 years 8 months ago
2002
IEEE
1 The objective of this paper is to propose a new fault model suitable for test pattern generation for an FPGA configured to implement a given application. The paper demonstrates t...
112
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FPL
2009
Springer
15 years 7 months ago
2009
Springer
Automated code generation and performance tuning techniques for concurrent architectures such as GPUs, Cell and FPGAs can provide integer factor speedups over multi-core processor...
112
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IUI
2010
ACM
16 years 2 days ago
2010
ACM
We have developed a simulator to help with the design and evaluation of assistive interfaces. The simulator can predict possible interaction patterns when undertaking a task using...
KDD
1994
ACM
15 years 7 months ago
1994
ACM
: Weexemplify in this paper, howa discovery system is applied to the analysis of simulation experimentsin practical political planning, andshowwhatkind of newknowledgecan be discov...