1459 search results - page 149 / 292 » Statistical Modeling for Circuit Simulation |
117
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VLSID
2004
IEEE
16 years 1 months ago
2004
IEEE
Abstract--In this paper, we present a new approach to calculate the steady state resistance values for CMOS library gates. These resistances are defined as simple equivalent models...
115
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IPPS
2006
IEEE
15 years 7 months ago
2006
IEEE
Models of simulation program with integrated circuit emphasis (SPICE) are currently playing a central role in the connection between circuit design and chip fabrication communitie...
103
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DATE
1999
IEEE
15 years 5 months ago
1999
IEEE
Software programming languages, such as C/C++, have been used as means for specifying hardware for quite a while. Different design methodologies have exploited the advantages of f...
DATE
2010
IEEE
15 years 6 months ago
2010
IEEE
With aggressive gate oxide scaling, latent defects in the gate oxide manifest as traps that, in time, lead to gate oxide breakdown. Progressive gate oxide breakdown, also referred...
116
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VTS
2002
IEEE
15 years 6 months ago
2002
IEEE
A device testing method called Transient Signal Analysis (TSA) is subjected to elements of a real process and testing environment in this paper. Simulations experiments are design...