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» Statistical Modeling for Circuit Simulation
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VTS
1996
IEEE
74views Hardware» more  VTS 1996»
15 years 5 months ago
An unexpected factor in testing for CMOS opens: the die surface
In this paper, we for the rst time present experimental evidence that the die surface can act as an RC interconnect, becoming an important factor in determining the voltage of a o...
Haluk Konuk, F. Joel Ferguson
86
Voted
ISCAS
2005
IEEE
207views Hardware» more  ISCAS 2005»
15 years 6 months ago
A novel low-power input-independent MOS AC/DC charge pump
: This paper presents a novel fully integrated MOS AC to DC charge pump with low power dissipation and stable output for RFID applications. To improve the input sensitivity, we rep...
Yuan Yao, Yin Shi, Foster F. Dai
101
Voted
HICSS
2006
IEEE
118views Biometrics» more  HICSS 2006»
15 years 6 months ago
An Estimator of Propagation of Cascading Failure
— We suggest a statistical estimator to measure the extent to which failures propagate in cascading failures such as large blackouts. The estimator is tested on a saturating bran...
Ian Dobson, Kevin R. Wierzbicki, Benjamin A. Carre...
92
Voted
IVC
1998
65views more  IVC 1998»
15 years 14 days ago
Segmentation of MR images with intensity inhomogeneities
A statistical model to segment clinical magnetic resonance (MR) images in the presence of noise and intensity inhomogeneities is proposed. Inhomogeneities are considered to be mul...
Jagath C. Rajapakse, Frithjof Kruggel
102
Voted
WSC
2004
15 years 2 months ago
Building Credible Input Models
Most discrete-event simulation models have stochastic elements that mimic the probabilistic nature of the system under consideration. A close match between the input model and the...
Lawrence Leemis