Most discrete-event simulation models have stochastic elements that mimic the probabilistic nature of the system under consideration. A close match between the input model and the...
A structurally testable delay fault might become untestable in the functional mode of the circuit due to logic or timing constraints or both. Experimental data suggests that there...
The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
Udo Sobe, Karl-Heinz Rooch, Andreas Ripp, Michael ...
Recently, several studies have analyzed the statistical properties of low power wireless links in real environments, clearly demonstrating the differences between experimentally o...
Alberto Cerpa, Jennifer L. Wong, Miodrag Potkonjak...
We present a novel approach, based on probabilistic formal methods, to developing cross-layer resource optimization policies for resource limited distributed systems. One objective...
Minyoung Kim, Mark-Oliver Stehr, Carolyn L. Talcot...