1459 search results - page 187 / 292 » Statistical Modeling for Circuit Simulation |
96
Voted
ISQED
2010
IEEE
15 years 7 months ago
2010
IEEE
With the CMOS transistors being scaled to sub 45nm and lower, Negative Bias Temperature Instability (NBTI) has become a major concern due to its impact on PMOS transistor aging pr...
86
Voted
ISQED
2009
IEEE
15 years 7 months ago
2009
IEEE
An outstanding challenge for realizing nanoelectronic systems is nano-interface design, i.e., how to precisely access a nanoscale wire in an array for communication between a nano...
136
click to vote
ISQED
2006
IEEE
15 years 6 months ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) has the potential to become one of the main show-stoppers of circuit reliability in nanometer scale devices due to its deleterious ...
79
Voted
ISCAS
1999
IEEE
15 years 5 months ago
1999
IEEE
This paper describes the design of a low-voltage translinear second-order quadrature oscillator. The circuit is a direct implementation of a nonlinear second-order state-space desc...
113
Voted
DAC
2010
ACM
15 years 4 months ago
2010
ACM
The identification of speedpaths is required for post-silicon (PS) timing validation, and it is currently becoming timeconsuming due to manufacturing variations. In this paper we...