We examine delay models used in VLSI circuit testing. Our study includes electrical-level simulation experiments with HSPICE. We show phenomena which signicantly aect the actual...
This paper describes a new post-silicon validation problem for diagnosing systematic timing errors. We illustrate the differences between timing validation and the traditional log...
Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, T. M....
This paper discusses how simulation is used to design new manufacturing systems and to improve the performance of existing ones. Topics to be discussed include: manufacturing issu...
We propose a methodology for applying gate-level logic transformations to optimize power in digital circuits. Statistically simulated[14] switching information, gate delays, signa...
In this paper we present a methodology and techniques for generating cycle-accurate macro-models for RTlevel power analysis. The proposed macro-model predicts not only...