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EURODAC
1995
IEEE
126views VHDL» more  EURODAC 1995»
15 years 3 months ago
Quality considerations in delay fault testing
We examine delay models used in VLSI circuit testing. Our study includes electrical-level simulation experiments with HSPICE. We show phenomena which signi cantly a ect the actual...
Alicja Pierzynska, Slawomir Pilarski
ITC
2003
IEEE
126views Hardware» more  ITC 2003»
15 years 5 months ago
Diagnosis-Based Post-Silicon Timing Validation Using Statistical Tools and Methodologies
This paper describes a new post-silicon validation problem for diagnosing systematic timing errors. We illustrate the differences between timing validation and the traditional log...
Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, T. M....
WSC
1998
15 years 1 months ago
Simulation of Manufacturing Systems
This paper discusses how simulation is used to design new manufacturing systems and to improve the performance of existing ones. Topics to be discussed include: manufacturing issu...
Averill M. Law, Michael G. McComas
DAC
1997
ACM
15 years 3 months ago
Technology-Dependent Transformations for Low-Power Synthesis
We propose a methodology for applying gate-level logic transformations to optimize power in digital circuits. Statistically simulated[14] switching information, gate delays, signa...
Rajendran Panda, Farid N. Najm
ISLPED
1997
ACM
114views Hardware» more  ISLPED 1997»
15 years 4 months ago
Cycle-accurate macro-models for RT-level power analysis
 In this paper we present a methodology and techniques for generating cycle-accurate macro-models for RTlevel power analysis. The proposed macro-model predicts not only...
Qinru Qiu, Qing Wu, Massoud Pedram, Chih-Shun Ding