1459 search results - page 56 / 292 » Statistical Modeling for Circuit Simulation |
ICCAD
1995
IEEE
15 years 3 months ago
1995
IEEE
This paper presents a method to characterize Nyquist rate A/D converters based on the use of a first order statistical behavioral model. The proposed model is derived from a very...
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DFT
2003
IEEE
15 years 5 months ago
2003
IEEE
Delay faults are an increasingly important test challenge. Traditional delay fault models are incomplete in that they only model a subset of delay defect behaviors. To solve this ...
DAC
2005
ACM
16 years 24 days ago
2005
ACM
Since across-chip interconnect delays can exceed a clock cycle in nanometer technologies, it has become essential in high performance designs to add flip-flops on wires with multi...
GLVLSI
2006
IEEE
15 years 5 months ago
2006
IEEE
We study gate delay variation caused by crosstalk aggressor alignment, i.e., difference of signal arrival times in coupled neighboring interconnects. This effect is as significan...
TCAD
2008
14 years 11 months ago
2008
The nonuniform substrate thermal profile and process variations are two major concerns in the present-day ultradeep submicrometer designs. To correctly predict performance/ leakage...