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VLSID
2008
IEEE
149views VLSI» more  VLSID 2008»
16 years 6 days ago
NBTI Degradation: A Problem or a Scare?
Negative Bias Temperature Instability (NBTI) has been identified as a major and critical reliability issue for PMOS devices in nano-scale designs. It manifests as a negative thres...
Kewal K. Saluja, Shriram Vijayakumar, Warin Sootka...
TSP
2011
170views more  TSP 2011»
14 years 6 months ago
Model Selection for Sinusoids in Noise: Statistical Analysis and a New Penalty Term
—Detection of the number of sinusoids embedded in noise is a fundamental problem in statistical signal processing. Most parametric methods minimize the sum of a data fit (likeli...
Boaz Nadler, Leonid Kontorovich
SAB
2010
Springer
150views Optimization» more  SAB 2010»
14 years 9 months ago
Internal Models in the Cerebellum: A Coupling Scheme for Online and Offline Learning in Procedural Tasks
The cerebellum plays a major role in motor control. It is thought to mediate the acquisition of forward and inverse internal models of the bodyenvironment interaction [1]. In this ...
Jean-Baptiste Passot, Niceto Luque, Angelo Arleo
DAC
1998
ACM
16 years 24 days ago
A Mixed Nodal-Mesh Formulation for Efficient Extraction and Passive Reduced-Order Modeling of 3D Interconnects
As VLSI circuit speeds have increased, reliable chip and system design can no longer be performed without accurate threedimensional interconnect models. In this paper, we describe...
Nuno Alexandre Marques, Mattan Kamon, Jacob White,...
WSC
2000
15 years 1 months ago
Simulation as educational support for production and logistics in industrial engineering
The proposed implementation is a monitor system able to train operators for on-line real time manufacturing control in order to analyze the performance of a production process. Th...
Agostino G. Bruzzone, Pietro Giribone, Roberto Rev...