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ET
2000
145views more  ET 2000»
14 years 11 months ago
Fast Test Pattern Generation for Sequential Circuits Using Decision Diagram Representations
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
Jaan Raik, Raimund Ubar
DAC
2005
ACM
16 years 25 days ago
Scalable trajectory methods for on-demand analog macromodel extraction
Trajectory methods sample the state trajectory of a circuit as it simulates in the time domain, and build macromodels by reducing and interpolating among the linearizations create...
Saurabh K. Tiwary, Rob A. Rutenbar
CORR
2010
Springer
95views Education» more  CORR 2010»
14 years 9 months ago
When are feedforward microcircuits well-modeled by maximum entropy methods?
Describing the collective activity of neural populations is a daunting task: the number of possible patterns grows exponentially with the number of cells, resulting in practically...
Andrea K. Barreiro, Julijana Gjorgjieva, Fred Riek...
DAC
2007
ACM
15 years 3 months ago
SBPOR: Second-Order Balanced Truncation for Passive Order Reduction of RLC Circuits
RLC circuits have been shown to be better formulated as second-order systems instead of first-order systems. The corresponding model order reduction techniques for secondorder sys...
Boyuan Yan, Sheldon X.-D. Tan, Pu Liu, Bruce McGau...
ICCAD
2009
IEEE
121views Hardware» more  ICCAD 2009»
14 years 9 months ago
MOLES: Malicious off-chip leakage enabled by side-channels
Economic incentives have driven the semiconductor industry to separate design from fabrication in recent years. This trend leads to potential vulnerabilities from untrusted circui...
Lang Lin, Wayne Burleson, Christof Paar