1548 search results - page 192 / 310 » Statistical Modelling of CSP Solving Algorithms Performance |
NIPS
2007
14 years 11 months ago
2007
A novel approach to measure the interdependence of two time series is proposed, referred to as “stochastic event synchrony” (SES); it quantifies the alignment of two point pr...
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CVPR
2009
IEEE
16 years 5 months ago
2009
IEEE
Estimating the illumination and the reflectance properties
of an object surface from a sparse set of images is an
important but inherently ill-posed problem. The problem
becomes...
MICCAI
2008
Springer
15 years 11 months ago
2008
Springer
We propose a method that computes a conformal mapping from a multiply connected mesh to the so-called slit domain, which consists of a canonical rectangle or disk in which 3D curve...
EVOW
2008
Springer
14 years 11 months ago
2008
Springer
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
ICML
2008
IEEE
15 years 10 months ago
2008
IEEE
This paper introduces a novel machine learning model called multiple instance ranking (MIRank) that enables ranking to be performed in a multiple instance learning setting. The mo...