1548 search results - page 192 / 310 » Statistical Modelling of CSP Solving Algorithms Performance |
108
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NIPS
2007
15 years 3 months ago
2007
A novel approach to measure the interdependence of two time series is proposed, referred to as “stochastic event synchrony” (SES); it quantifies the alignment of two point pr...
185
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CVPR
2009
IEEE
16 years 9 months ago
2009
IEEE
Estimating the illumination and the reflectance properties
of an object surface from a sparse set of images is an
important but inherently ill-posed problem. The problem
becomes...
133
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MICCAI
2008
Springer
16 years 3 months ago
2008
Springer
We propose a method that computes a conformal mapping from a multiply connected mesh to the so-called slit domain, which consists of a canonical rectangle or disk in which 3D curve...
95
Voted
EVOW
2008
Springer
15 years 4 months ago
2008
Springer
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
103
Voted
ICML
2008
IEEE
16 years 3 months ago
2008
IEEE
This paper introduces a novel machine learning model called multiple instance ranking (MIRank) that enables ranking to be performed in a multiple instance learning setting. The mo...