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DAC
2007
ACM
16 years 4 months ago
Width-dependent Statistical Leakage Modeling for Random Dopant Induced Threshold Voltage Shift
Statistical behavior of device leakage and threshold voltage shows a strong width dependency under microscopic random dopant fluctuation. Leakage estimation using the conventional...
Jie Gu, Sachin S. Sapatnekar, Chris H. Kim
ICCAD
2003
IEEE
379views Hardware» more  ICCAD 2003»
15 years 12 months ago
A Statistical Gate-Delay Model Considering Intra-Gate Variability
This paper proposes a model for calculating statistical gate-delay variation caused by intra-chip and inter-chip variability. As the variation of individual gate delays directly i...
Ken-ichi Okada, Kento Yamaoka, Hidetoshi Onodera
MICCAI
2004
Springer
15 years 8 months ago
Statistical Shape Modelling of the Levator Ani with Thickness Variation
The levator ani is vulnerable to injury during childbirth and effective surgical intervention requires full knowledge of the morphology and mechanical properties of the muscle stru...
Su-Lin Lee, Paramate Horkaew, Ara Darzi, Guang-Zho...
ICPR
2002
IEEE
16 years 4 months ago
Mixture Models for Dynamic Statistical Pressure Snakes
Wael Abd-Almageed, Christopher E. Smith