29 search results - page 3 / 6 » Statistical Timing Analysis for Intra-Die Process Variations... |
DAC
2006
ACM
14 years 7 months ago
2006
ACM
For statistical timing and power analysis that are very important problems in the sub-100nm technologies, stochastic analysis of power grids that characterizes the voltage fluctua...
DAC
2004
ACM
14 years 7 months ago
2004
ACM
Current technology trends have led to the growing impact of both inter-die and intra-die process variations on circuit performance. While it is imperative to model parameter varia...
DAC
2005
ACM
14 years 7 months ago
2005
ACM
Recent study shows that the existing first order canonical timing model is not sufficient to represent the dependency of the gate delay on the variation sources when processing an...
Publication
Within-die process variations arise during integrated circuit (IC) fabrication in the sub-100nm regime. These variations are of paramount concern as they deviate the performance of...
GLOBECOM
2006
IEEE
14 years 8 days ago
2006
IEEE
— This paper presents non-linear precoding design in closed-loop multiple-input multiple-output (MIMO) orthogonal frequency-division multiplexing (OFDM) over spatiallycorrelated,...