936 search results - page 14 / 188 » Statistical analysis of simulation output |
DATE
2010
IEEE
15 years 3 months ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
ISQED
2005
IEEE
15 years 3 months ago
2005
IEEE
This paper discusses clock skew due to manufacturing variability and environmental change. In clock tree design, transition time constraint is an important design parameter that c...
DAC
2000
ACM
15 years 2 months ago
2000
ACM
Abstract: This paper presents a new statistical methodology to simulate the effect of both inter-die and intra-die variation on the electrical performance of analog integrated circ...
ISCC
2009
IEEE
15 years 4 months ago
2009
IEEE
Abstract—This paper presents a novel scalable switching architecture for input queued switches with its proper arbitration algorithms. In contrast to traditional switching archit...
EOR
2006
14 years 10 months ago
2006
Simulation experiments are often analyzed through a linear regression model of their input/output data. Such an analysis yields a metamodel or response surface for the underlying ...