17 search results - page 2 / 4 » Statistical design and optimization of SRAM cell for yield e... |
ICCAD
2009
IEEE
13 years 4 months ago
2009
IEEE
In this paper, an adaptive sampling method is proposed for the statistical SRAM cell analysis. The method is composed of two components. One part is the adaptive sampler that manip...
DATE
2005
IEEE
13 years 8 months ago
2005
IEEE
Operating frequency of a pipelined circuit is determined by the delay of the slowest pipeline stage. However, under statistical delay variation in sub-100nm technology regime, the...
DAC
2011
ACM
12 years 6 months ago
2011
ACM
SRAM design has been a major challenge for nanoscale manufacturing technology. We propose a new bit cell repair scheme for designing maximum-information memory system (MIMS). Unli...
DATE
2007
IEEE
14 years 23 days ago
2007
IEEE
An important aspect of Design for Yield for embedded SRAM is identifying the expected worst case behavior in order to guarantee that sufficient design margin is present. Previousl...
ICCAD
2009
IEEE
13 years 4 months ago
2009
IEEE
SRAM cell design is driven by the need to satisfy static noise margin, write margin and read current margin (RCM) over all cells in the array in an energy-efficient manner. These ...