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» Statistical fault injection: Quantified error and confidence
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PATMOS
2007
Springer
15 years 5 months ago
Soft Error-Aware Power Optimization Using Gate Sizing
—Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the...
Foad Dabiri, Ani Nahapetian, Miodrag Potkonjak, Ma...
TCAD
2008
172views more  TCAD 2008»
14 years 11 months ago
General Methodology for Soft-Error-Aware Power Optimization Using Gate Sizing
Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the mos...
Foad Dabiri, Ani Nahapetian, Tammara Massey, Miodr...