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» Statistical gate sizing for timing yield optimization
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PATMOS
2007
Springer
15 years 3 months ago
A Statistical Approach to the Timing-Yield Optimization of Pipeline Circuits
Abstract. The continuous miniaturization of semiconductor devices imposes serious threats to design robustness against process variations and environmental fluctuations. Modern ci...
Chin-Hsiung Hsu, Szu-Jui Chou, Jie-Hong Roland Jia...
63
Voted
ISQED
2007
IEEE
146views Hardware» more  ISQED 2007»
15 years 3 months ago
An Exploratory Study on Statistical Timing Analysis and Parametric Yield Optimization
Ayhan A. Mutlu, Kelvin J. Le, Mustafa Celik, Dar-s...
68
Voted
DATE
2000
IEEE
85views Hardware» more  DATE 2000»
15 years 1 months ago
Gate Sizing Using a Statistical Delay Model
This paper is about gate sizing under a statistical delay model. It shows we can solve the gate sizing problem exactly for a given statistical delay model. The formulation used al...
E. T. A. F. Jacobs, Michel R. C. M. Berkelaar
VLSID
2007
IEEE
120views VLSI» more  VLSID 2007»
15 years 10 months ago
Statistical Leakage and Timing Optimization for Submicron Process Variation
Leakage power is becoming a dominant contributor to the total power consumption and dual-Vth assignment is an efficient technique to decrease leakage power, for which effective de...
Yuanlin Lu, Vishwani D. Agrawal
DAC
2004
ACM
15 years 10 months ago
Statistical optimization of leakage power considering process variations using dual-Vth and sizing
timing analysis tools to replace standard deterministic static timing analyzers whereas [8,27] develop approaches for the statistical estimation of leakage power considering within...
Ashish Srivastava, Dennis Sylvester, David Blaauw