2286 search results - page 12 / 458 » Statistical timing analysis based on a timing yield model |
ICCAD
2005
IEEE
15 years 8 months ago
2005
IEEE
— Process variations cause significant timing uncertainty and yield degradation in deep sub-micron technologies. A solution to counter timing uncertainty is post-silicon clock t...
CORR
2004
Springer
14 years 11 months ago
2004
Springer
We propose a model for the World Wide Web graph that couples the topological growth with the traffic's dynamical evolution. The model is based on a simple traffic-driven dynam...
CODES
2006
IEEE
15 years 5 months ago
2006
IEEE
Process variability has a detrimental impact on the performance of memories and other system components, which can lead to parametric yield loss at the system level due to timing ...
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DAC
2008
ACM
16 years 21 days ago
2008
ACM
Current source based cell models are becoming a necessity for accurate timing and noise analysis at 65nm and below. Voltage waveform shapes are increasingly more difficult to repr...
VLSID
2005
IEEE
16 years 2 days ago
2005
IEEE
This paper employs general multivariate normal distribution to develop a new efficient statistical timing analysis methodology. The paper presents the theoretical framework of the...