2286 search results - page 6 / 458 » Statistical timing analysis based on a timing yield model |
ICCAD
2006
IEEE
15 years 8 months ago
2006
IEEE
Statistical Static Timing Analysis has received wide attention recently and emerged as a viable technique for manufacturability analysis. To be useful, however, it is important th...
ITC
2003
IEEE
15 years 4 months ago
2003
IEEE
An early-life reliability model is presented that allows wafer test information to be used to predict not only the total number of burn-in failures that occur for a given product,...
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DATE
2008
IEEE
15 years 6 months ago
2008
IEEE
—Latch based circuits are widely adopted in high performance circuits. But there is a lack of accurate latch models for doing timing analysis. In this paper, we propose a new lat...
ICCD
2007
IEEE
15 years 8 months ago
2007
IEEE
We have developed a new statistical timing analysis approach that does not impose any assumptions on the nature of manufacturing variability and takes into account an arbitrary mo...
DATE
2003
IEEE
15 years 5 months ago
2003
IEEE
Abstract — This paper defines a new diagnosis problem for diagnosing delay defects based upon statistical timing models. We illustrate the differences between the delay defect d...