2286 search results - page 7 / 458 » Statistical timing analysis based on a timing yield model |
102
Voted
ICCAD
2006
IEEE
15 years 8 months ago
2006
IEEE
Statistical static timing analysis (SSTA) has become a key method for analyzing the effect of process variation in aggressively scaled CMOS technologies. Much research has focused...
DAC
2008
ACM
16 years 19 days ago
2008
ACM
: Spin-Torque Transfer Magnetic RAM (STT MRAM) is a promising candidate for future universal memory. It combines the desirable attributes of current memory technologies such as SRA...
BMCBI
2010
14 years 11 months ago
2010
Background: Large-scale genomic studies often identify large gene lists, for example, the genes sharing the same expression patterns. The interpretation of these gene lists is gen...
ICCAD
1998
IEEE
15 years 3 months ago
1998
IEEE
This paper presents an efficient statistical design methodology that allows simultaneous sizing for performance and optimization for yield and robustness of analog circuits. The s...
ASPDAC
2010
ACM
14 years 9 months ago
2010
ACM
Level-sensitive transparent latches are widely used in high-performance sequential circuit designs. Under process variations, the timing of a transparently latched circuit will ada...