10 search results - page 1 / 2 » Statistical timing for parametric yield prediction of digita... |
73
Voted
DAC
2003
ACM
16 years 1 months ago
2003
ACM
116
Voted
DAC
2003
ACM
16 years 1 months ago
2003
ACM
In the way they cope with variability, present-day methodologies are onerous, pessimistic and risky, all at the same time! Dealing with variability is an increasingly important as...
90
Voted
DAC
2004
ACM
16 years 1 months ago
2004
ACM
Starting from a model of the within-die systematic variations using principal components analysis, a model is proposed for estimation of the parametric yield, and is then applied ...
FPGA
2007
ACM
15 years 6 months ago
2007
ACM
Variations in the semiconductor fabrication process results in variability in parameters between transistors on the same die, a problem exacerbated by lithographic scaling. The re...
DAC
2004
ACM
15 years 5 months ago
2004
ACM
Leakage current has become a stringent constraint in today’s processor designs in addition to traditional constraints on frequency. Since leakage current exhibits a strong inver...