Automatic pattern search in event traces is a powerful method to identify performance problems in parallel applications. We demonstrate that knowledge about the virtual topology, ...
Nikhil Bhatia, Fengguang Song, Felix Wolf, Jack Do...
A structurally testable delay fault might become untestable in the functional mode of the circuit due to logic or timing constraints or both. Experimental data suggests that there...
This paper introduces the notion of a software decelerator, to be used in logic-centric system architectures. Functions are offloaded from logic to a processor, accepting a speed ...
Eric Keller, Gordon J. Brebner, Philip James-Roxby
Abstract. We present a theorem proving environment for the development of reliable and efficient group communication systems. Our approach makes methods of automated deduction appl...
Designing a testable circuit is often a two step process. First, the circuit is designed to conform to the functional specifications. Then, the testability aspects are added. By t...