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ICPP
2005
IEEE
15 years 7 months ago
Automatic Experimental Analysis of Communication Patterns in Virtual Topologies
Automatic pattern search in event traces is a powerful method to identify performance problems in parallel applications. We demonstrate that knowledge about the virtual topology, ...
Nikhil Bhatia, Fengguang Song, Felix Wolf, Jack Do...
ISQED
2003
IEEE
147views Hardware» more  ISQED 2003»
15 years 7 months ago
On Structural vs. Functional Testing for Delay Faults
A structurally testable delay fault might become untestable in the functional mode of the circuit due to logic or timing constraints or both. Experimental data suggests that there...
Angela Krstic, Jing-Jia Liou, Kwang-Ting Cheng, Li...
FPL
2003
Springer
81views Hardware» more  FPL 2003»
15 years 7 months ago
Software Decelerators
This paper introduces the notion of a software decelerator, to be used in logic-centric system architectures. Functions are offloaded from logic to a processor, accepting a speed ...
Eric Keller, Gordon J. Brebner, Philip James-Roxby
CADE
1998
Springer
15 years 6 months ago
A Proof Environment for the Development of Group Communication Systems
Abstract. We present a theorem proving environment for the development of reliable and efficient group communication systems. Our approach makes methods of automated deduction appl...
Christoph Kreitz, Mark Hayden, Jason Hickey
VTS
1996
IEEE
111views Hardware» more  VTS 1996»
15 years 6 months ago
Synthesis-for-scan and scan chain ordering
Designing a testable circuit is often a two step process. First, the circuit is designed to conform to the functional specifications. Then, the testability aspects are added. By t...
Robert B. Norwood, Edward J. McCluskey