631 search results - page 84 / 127 » Strong Authentication and Strong Integrity (SASI) Is Not Tha... |
109
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ISQED
2008
IEEE
15 years 8 months ago
2008
IEEE
Negative bias temperature instability (NBTI) is one of the primary limiters of reliability lifetime in nano-scale integrated circuits. NBTI manifests itself in a gradual increase ...
113
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ACSAC
2007
IEEE
15 years 8 months ago
2007
IEEE
This paper describes the security and network architecture of the Annex system, a family of technologies for secure and pervasive communication and information processing that we ...
110
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DATE
2007
IEEE
15 years 8 months ago
2007
IEEE
Abstract— Modern integrated radio systems require highly linear analog/RF circuits. Two-tone simulations are commonly used to study a circuit’s nonlinear behavior. Very often, ...
115
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ICDCSW
2007
IEEE
15 years 8 months ago
2007
IEEE
1 Challenges of scale have limited the development of event notification systems with strong properties, despite the urgent demand for consistency, reliability, security, and other...
115
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ICDE
2007
IEEE
15 years 8 months ago
2007
IEEE
In this work, we propose a multi-relational concept discovery method for business intelligence applications. Multi-relational data mining finds interesting patterns that span ove...