We present a statistical debugging algorithm that isolates bugs in programs containing multiple undiagnosed bugs. Earlier statistical algorithms that focus solely on identifying p...
Ben Liblit, Mayur Naik, Alice X. Zheng, Alexander ...
As the CMOS technology is scaled into the dimension of nanometer, the clock frequencies and die sizes of ICs are shown to be increasing steadily [5]. Today, global wires that requ...
As the use of Semantic Web ontologies continues to expand there is a growing need for tools that can validate ontological consistency and provide guidance in the correction of dete...
Kenneth Baclawski, Christopher J. Matheus, Mieczys...
— A number of large-scale distributed Internet applications could potentially benefit from some level of knowledge about the relative proximity between its participating host no...
Sylvia Ratnasamy, Mark Handley, Richard M. Karp, S...
— This paper presents a new method for creating a single panoramic image of a long bone from several individual fluoroscopic X-ray images. Panoramic images are useful preoperati...