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ATS
2005
IEEE
84views Hardware» more  ATS 2005»
15 years 9 months ago
Current Testing for Nanotechnologies: A Demystifying Application Perspective.
: This paper addresses the challenges imposed on current testing with the advent of Nanotechnologies. It shows why existing measurement solutions embedded in ATE systems are not ad...
Hans A. R. Manhaeve
ASAP
2004
IEEE
102views Hardware» more  ASAP 2004»
15 years 7 months ago
A Hierarchical Classification Scheme to Derive Interprocess Communication in Process Networks
The Compaan compiler automatically derives a Process Network (PN) description from an application written in Matlab. The basic element of a PN is a Producer/Consumer (P/C) pair. F...
Alexandru Turjan, Bart Kienhuis, Ed F. Deprettere
SPE
2008
108views more  SPE 2008»
15 years 3 months ago
Effective asymmetric XML compression
The innate verbosity of the Extensible Markup Language remains one of its main weaknesses, especially when large XML documents are concerned. This problem can be solved with the a...
Przemyslaw Skibinski, Szymon Grabowski, Jakub Swac...
METRICS
2003
IEEE
15 years 9 months ago
When Can We Test Less?
When it is impractical to rigorously assess all parts of complex systems, test engineers use defect detectors to focus their limited resources. In this article, we define some pr...
Tim Menzies, Justin S. Di Stefano, Kareem Ammar, K...
FPT
2005
IEEE
133views Hardware» more  FPT 2005»
15 years 9 months ago
FPGA-Based Conformance Testing and System Prototyping of an MPEG-4 SA-DCT Hardware Accelerator
Two FPGA implementations of a Shape Adaptive Discrete Cosine Transform (SA-DCT) accelerator are presented in this paper: one PCI-based and the other AMBA-based. The former is used...
Andrew Kinane, Alan Casey, Valentin Muresan, Noel ...