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VTS
2005
IEEE
95views Hardware» more  VTS 2005»
15 years 10 months ago
SRAM Retention Testing: Zero Incremental Time Integration with March Algorithms
Testing data retention faults (DRFs), particularly in integrated systems on chip comprised of very large number of various sizes and types of embedded SRAMs is challenging and typ...
Baosheng Wang, Yuejian Wu, Josh Yang, André...
INFSOF
2007
104views more  INFSOF 2007»
15 years 4 months ago
A state-based approach to integration testing based on UML models
: Correct functioning of object-oriented software depends upon the successful integration of classes. While individual classes may function correctly, several new faults can arise ...
Shaukat Ali, Lionel C. Briand, Muhammad Jaffar-Ur ...
IEE
2010
185views more  IEE 2010»
15 years 2 months ago
Judy - a mutation testing tool for Java
Popular code coverage measures, such as branch coverage, are indicators of the thoroughness rather than the fault detection capability of test suites. Mutation testing is a fault-...
Lech Madeyski, N. Radyk
SSIRI
2010
15 years 2 months ago
A Formal Framework for Mutation Testing
— Model-based approaches, especially based on directed graphs (DG), are becoming popular for mutation testing as they enable definition of simple, nevertheless powerful, mutation...
Fevzi Belli, Mutlu Beyazit
SAC
2009
ACM
15 years 11 months ago
A passive conformance testing approach for a MANET routing protocol
In this paper we propose a passive conformance testing technique applied to a Mobile ad hoc network (MANET) routing protocol, OLSR, that is characterized by a dynamically changing...
Ana R. Cavalli, Stéphane Maag, Edgardo Mont...