Abstract—A poorly understood but important factor in random testing is the selection of a maximum length for test runs. Given a limited time for testing, it is seldom clear wheth...
James H. Andrews, Alex Groce, Melissa Weston, Ru-G...
In this paper we investigate optimal voltage testing approaches for physically-based faults in CMOS circuits. We describe the general nature of the problem and then focus on two f...
This paper presents a methodology and a set of tools for the modelling, validation and testing of Web service composition, conceived and developed within the French national projec...
Ana R. Cavalli, Tien-Dung Cao, Wissam Mallouli, El...
This paper presents the design and evaluation of a text categorization method based on the Hierarchical Mixture of Experts model. This model uses a divide and conquer principle to ...
Many test data compression schemes are based on LFSR reseeding. A drawback of these schemes is that the unspecified bits are filled with random values resulting in a large number ...