2119 search results - page 47 / 424 » Structure-Preserving Model Reduction |
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DAC
1999
ACM
15 years 2 months ago
1999
ACM
This paper presents a method to reduce the complexity of a linear or linearized (small-signal) analog circuit. The reduction technique, based on quality-error ranking, can be used...
JIPS
2010
14 years 4 months ago
2010
Test scenarios can be derived based on some system models for requirements validation purposes. Model-based test suite reduction aims to provide a smaller set of test scenarios whi...
ICCAD
2006
IEEE
15 years 6 months ago
2006
IEEE
— Trajectory-based methods offer an attractive methodology for automated, on-demand generation of macromodels for custom circuits. These models are generated by sampling the stat...
ETS
2007
IEEE
15 years 4 months ago
2007
IEEE
This paper summarizes advanced test patterns designed to target dynamic and time-related faults caused by new defect mechanisms in deep-submicron memory technologies. Such tests a...
SPIN
2005
Springer
15 years 3 months ago
2005
Springer
We describe an improvement of the partial-order reduction algorithm for breadth-first search which was introduced in Spin version 4.0. Our improvement is based on the algorithm by...