2096 search results - page 183 / 420 » Structured Parameter Elicitation |
110
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DATE
2006
IEEE
15 years 10 months ago
2006
IEEE
Defect density and defect size distributions (DDSDs) are key parameters used in IC yield loss predictions. Traditionally, memories and specialized test structures have been used t...
133
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ICDM
2006
IEEE
15 years 10 months ago
2006
IEEE
Measurements at different time points and positions in large temporal or spatial databases requires effective and efficient data mining techniques. For several parallel measureme...
112
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LSSC
2005
Springer
15 years 10 months ago
2005
Springer
Abstract. In this paper we discuss an inclusion method for solving rectangular (over- and under-determined) dense linear systems where the input data are uncertain and vary within ...
128
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TSD
2004
Springer
15 years 9 months ago
2004
Springer
Abstract. A formal prosody model is proposed together with its application in a text-to-speech system. The model is based on a generative of abstract prosodic functionally involved...
112
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ITC
2003
IEEE
15 years 9 months ago
2003
IEEE
The objective of this paper is to present an infrastructure IP (I-IP) designed to characterize yield loss in the process back-end. The I-IP structure is described in using a botto...